发明名称 Methods of processing semiconductor wafer and producing IC card, and carrier
摘要 The semiconductor wafer is made thin without any cracks and warp under good workability. The semiconductor wafer thinning process includes the first step of preparing a carrier 1 formed of a base 1a and a suction pad 1b provided on one surface of the base 1a or formed of a base film with an adhesive, the second step of bonding a semiconductor wafer to the carrier 1 in such a manner that a rear surface of the semiconductor wafer 2 with no circuit elements formed therein is opposite to the carrier to form a wafer composite 10, and the third step of holding the carrier of the wafer composite 10 with its semiconductor wafer 2 side up and spin-coating an etchant on the rear surface of the semiconductor wafer 2 thereby to make the semiconductor wafer 2 thin.
申请公布号 US2002048907(A1) 申请公布日期 2002.04.25
申请号 US20010991750 申请日期 2001.11.26
申请人 HITACHI, LTD. 发明人 MIYAMOTO TOSHIO;TSUBOSAKI KUNIHIRO;USAMI MITSUO
分类号 G06K19/077;H01L21/301;H01L21/60;H01L21/68;H01L23/498;H01L23/538;(IPC1-7):H01L21/301 主分类号 G06K19/077
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