发明名称 Probe pin for a probe card
摘要 A probe card includes a card plate and a plurality of probe pins fixed onto the card plate. Each of the probe pins has a metallic body made of rhenium-containing tungsten, and a nickel film and a rhodium film consecutively formed on the metallic body by a plating technique using a liquid flow of a plating liquid.
申请公布号 US2002047721(A1) 申请公布日期 2002.04.25
申请号 US20010983171 申请日期 2001.10.23
申请人 NEC CORPORATION 发明人 MIKAMI KAZUNARI
分类号 G01R1/067;C25D7/00;G01R1/073;H01L21/48;H01L21/66;H01L23/485;(IPC1-7):G01R31/02 主分类号 G01R1/067
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