发明名称 |
Process and assembly to test an integrated circuit assembly using both analogue and digital signals |
摘要 |
In a process and assembly to test an electronic assembly using both analogue and digital signals employs mixed signal integrated circuits (IC) and digital test systems. Testing mixed signal ICs requires synchronization of impressed analogue signal forms combined with digital control of the ICs under test. Synchronization creates the parameter for accurate time prediction.
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申请公布号 |
DE10103961(A1) |
申请公布日期 |
2002.04.25 |
申请号 |
DE20011003961 |
申请日期 |
2001.01.30 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
GAIER, ULRICH;PRIDNIG, PETER |
分类号 |
G01R31/319;(IPC1-7):G01R31/316 |
主分类号 |
G01R31/319 |
代理机构 |
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地址 |
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