发明名称 |
Production of porous silicon used in the production of an optoelectronic component comprises chemically etching a silicon sample in an anodic oxidation process with localized etching |
摘要 |
Production of porous silicon comprises chemically etching a silicon sample (9) in an anodic oxidation process with localized etching taking place on an edge (10) or tip through a field concentration effect. Preferred Features: The edge or tip is a structure of the surface of the silicon sample. The silicon sample acts as the electrode. Recesses are produced in the conducting layer on the sample before carrying out anodic oxidation.
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申请公布号 |
DE10047664(A1) |
申请公布日期 |
2002.04.25 |
申请号 |
DE20001047664 |
申请日期 |
2000.09.26 |
申请人 |
HECKL, WOLFGANG M.;GOETTLICH, HAGEN |
发明人 |
HECKL, WOLFGANG M.;GOETTLICH, HAGEN |
分类号 |
C25F3/14;H01L21/306;(IPC1-7):H01L21/306;B81C3/00 |
主分类号 |
C25F3/14 |
代理机构 |
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主权项 |
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