发明名称 Production of porous silicon used in the production of an optoelectronic component comprises chemically etching a silicon sample in an anodic oxidation process with localized etching
摘要 Production of porous silicon comprises chemically etching a silicon sample (9) in an anodic oxidation process with localized etching taking place on an edge (10) or tip through a field concentration effect. Preferred Features: The edge or tip is a structure of the surface of the silicon sample. The silicon sample acts as the electrode. Recesses are produced in the conducting layer on the sample before carrying out anodic oxidation.
申请公布号 DE10047664(A1) 申请公布日期 2002.04.25
申请号 DE20001047664 申请日期 2000.09.26
申请人 HECKL, WOLFGANG M.;GOETTLICH, HAGEN 发明人 HECKL, WOLFGANG M.;GOETTLICH, HAGEN
分类号 C25F3/14;H01L21/306;(IPC1-7):H01L21/306;B81C3/00 主分类号 C25F3/14
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