发明名称 |
Ate timing measurement unit and method |
摘要 |
Automatic test equipment is disclosed for testing a semiconductor device and including a computer workstation and pin electronics circuitry coupled between the semiconductor device and the computer. The pin electronics circuitry includes a plurality of channels, each channel having timing circuitry operative in response to desired programmed timing information, driver/comparator circuitry coupled to the timing circuitry for driving test waveforms at a period T, and sampling data from the waveforms at a beat period T +/-DELTAt, and a timing measurement unit. The timing measurement unit is coupled to the driver/comparator circuitry for measuring the relative timings of the sampled data. The plurality of channels cooperate to produce substantially real-time timing measurement data in parallel. |
申请公布号 |
WO0192904(A3) |
申请公布日期 |
2002.04.25 |
申请号 |
WO2001US15780 |
申请日期 |
2001.05.16 |
申请人 |
TERADYNE, INC. |
发明人 |
BROWN, BENJAMIN;HULTINE, ERIK, V.;PANE, JOHN, ROBERT;FIRTH, ANDREW, DAMIAN;JIN, CHIYI;YANG, BINWEI |
分类号 |
G01R31/319;G01R31/28;G01R31/3193 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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