发明名称 Potential detecting circuit
摘要 In a detector included in a VPP generating circuit in a DRAM, an external power supply potential is applied to the gate of an N-channel MOS transistor for regulating a through current of an inverter for outputting an inversion signal of an output signal of a comparator. Since a drain-source voltage of the N-channel MOS transistor can be set to be lower than a threshold voltage Vthn of the N-channel MOS transistor, an operation margin of the detector under conditions of a low voltage and a low temperature is made wider as compared with a conventional technique.
申请公布号 US2002047731(A1) 申请公布日期 2002.04.25
申请号 US20010809212 申请日期 2001.03.16
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 OKAMOTO MAKO;TAITO YASUHIKO;MORISHITA FUKASHI;YAMAZAKI AKIRA;AKIYAMA MIHOKO;FUJII NOBUYUKI
分类号 G11C11/407;G05F1/10;G11C5/14;G11C11/4074;H02M3/07;(IPC1-7):H03K5/153 主分类号 G11C11/407
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