| 摘要 |
The invention relates to a method for scatter correction while forming a computed X-ray tomogram. The distribution of the scattered radiation is determined by means of the detector cells (7') which, because of the measuring method carried out, are shielded from direct irradiation in a two-dimensional, multi-cell detector field (3). This distribution is used to perform a scatter correction in the neighboring, directly irradiated detector cells (7). Furthermore, scatter correction can be performed by means of a computer simulation of the scatter processes. To this end, use is preferably made of a Monte Carlo method and the effect of the geometry and the material composition of the measuring arrangement, of the patient size, of the irradiated tissue and the like, is taken into account.
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