发明名称 Semiconductor device
摘要 It is an object of the present invention to provide a semiconductor device capable of decreasing electric resistance of a lower electrode provided therein, as well as capable of accurately responding to external signals having high frequencies inputted therein. The lower electrode 7 consists of three layers such as a silicon lower electrode layer 7a made of poly-crystalline silicon, a tungsten-silicide layer 7b made of tungsten silicide as a chemical compound of tungsten and silicon, and a protection layer 7c made of poly-crystalline silicon. By constructing the semiconductor device as described above, oxidation of the tungsten- silicide layer 7b may be prevented by the protection layer 7c made of poly-crystalline silicon even when oxidation layers of an ONO (silicon oxidation) layer 11 is formed by thermal oxidation. Consequently, electric resistance of the lower electrode 7 can be decreased.
申请公布号 US2002047204(A1) 申请公布日期 2002.04.25
申请号 US20010967720 申请日期 2001.09.28
申请人 HAYASHIZAKI HIROSHI 发明人 HAYASHIZAKI HIROSHI
分类号 H01L21/02;H01L21/28;H01L27/08;H01L29/49;(IPC1-7):H01L23/48 主分类号 H01L21/02
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