发明名称 Compact interferonmeter for measurement of angular displacement
摘要 <p>An interferometer system is used for high resolution measurment of angular displacement. Light from a laser diode 1 passes though a linear polariser 2 and is then split by a non-polarising beam-splitter 3 into two beams 1a and 1b, each linearly polarised and carrying the same temporal phase information. The polariser is set so that the state of polarisation is initially aligned with one of the axes of a polarising beam-splitter 5. One of the beams 1b enters the polarising beam splitter 5 where it is split into two further, orthogonally polarised beams 1c and 1d which are reflected by mirrors 6 and 7. The two beams are recombined in the polarising beam splitter 5 with a phase difference due to the difference in path lengths taken by the two. The recombined beam passes though a polariser 8 set at 45 degrees to the axes of the polarising beam splitter 5 and then observed by a detector 9. From the detected intensity the angular displacement R of the polarised beam-splitter can be calculated.</p>
申请公布号 GB0206102(D0) 申请公布日期 2002.04.24
申请号 GB20020006102 申请日期 2002.03.15
申请人 DEFREITAS, JOLYON 发明人
分类号 G01B9/02;G01B11/26 主分类号 G01B9/02
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