发明名称 Multi-layered gate for a CMOS imager
摘要 A multi-layered gate for use in a CMOS or CCD imager formed with a second gate at least partially overlapping it. The multi-layered gate is a complete gate stack having an insulating layer, a conductive layer, an optional silicide layer, and a second insulating layer, and has a second gate formed adjacent to it which has a second conductive layer that extends at least partially over the surface of the multi-layered gate. The multi-layered gate has improved insulation, thereby resulting in fewer shorts between the conductive layers of the two gates. Also disclosed are processes for forming the multi-layered gate and the overlapping gate.
申请公布号 US6376868(B1) 申请公布日期 2002.04.23
申请号 US19990333011 申请日期 1999.06.15
申请人 MICRON TECHNOLOGY, INC. 发明人 RHODES HOWARD E.
分类号 H01L21/336;H01L21/8238;H01L27/146;H01L27/148;H01L29/768;H01L31/00;H01L31/06;(IPC1-7):H01L29/76 主分类号 H01L21/336
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