发明名称 |
IC device inspection apparatus |
摘要 |
An IC device to be inspected is received in a chamber, and an IC tester Judges performance of the IC device. An electrical connection device is arranged outside the chamber and has a conductive passage electrically connecting between the IC tester and the IC device. An IC socket is retained on the electrical connection device, for having the IC device inserted therein. A magnetometric sensor is arranged close to the conductive passage of the electrical connection device, for detecting a magnetic field generated when electric current is supplied to the IC device. A temperature control device controls a temperature of the IC device. A control unit controls the temperature control device based on a signal delivered from the magnetometric sensor, to maintain the temperature of the IC device within a predetermined temperature range.
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申请公布号 |
US6377064(B1) |
申请公布日期 |
2002.04.23 |
申请号 |
US20000607165 |
申请日期 |
2000.06.29 |
申请人 |
NEC CORPORATION;Y.A.C. CO., LTD. |
发明人 |
KUROSU OSAMU;KAWAGUCHI KAZUHIRO;TSUJINO KAZUYA;TAKATA YASUYUKI;YOSHIDA KEISUKE |
分类号 |
G01R31/26;G01R15/20;G01R31/01;G01R31/28;(IPC1-7):F25B29/00 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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