发明名称 |
Lamination structure, wiring structure, manufacture thereof, and semiconductor device |
摘要 |
A first layer is disposed on the principal surface of a substrate. An adhesive layer made of Si containing fluorocarbon is disposed on the first layer. A second layer is disposed on the adhesive layer. One of the first and second layers is made of a material selected from a group consisting of a material whose main component is Si containing inorganic material, a metal, and an inorganic metal compound, and the other is made of an organic insulating film. Tight contactness of the organic layer to the layer whose main component is inorganic material can be improved.
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申请公布号 |
US6376048(B1) |
申请公布日期 |
2002.04.23 |
申请号 |
US19990227527 |
申请日期 |
1999.01.08 |
申请人 |
FUJITSU LIMITED |
发明人 |
TAKEISHI SHUNSAKU |
分类号 |
B32B7/12;H01L21/312;H01L21/314;H01L21/316;H01L21/768;H01L23/532;(IPC1-7):B32B9/04;B32B13/12 |
主分类号 |
B32B7/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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