发明名称 System and method for reducing surface defects integrated in circuits
摘要 The fabrication of integrated circuits entails the repeated application of many basic processing steps, for instance, planarization-the process of making a surface flat, or planar. One specific technique for making surfaces flat is chemical-mechanical planarization, which typically entails applying slurry onto a surface of an integrated circuit and polishing the surface with a rotating polishing head. The head includes several holes, known as slurry dispensers, through which slurry is applied to the surface. After completion of a polishing operation, gas is forced through the slurry dispensers to separate the surface from the rotating head. Unfortunately, the gas dries slurry remaining on the surface, causing slurry particles to stick to the polished surface, which ultimately cause defects in integrated circuits. Accordingly, the inventor devised a new method of polishing that applies a polishing head to a surface, dispenses slurry through a slurry dispenser in the polishing head onto the surface, polishes the surface, and then dispenses a substantially particulate-free liquid through the slurry dispenser to facilitate separation of the polishing head and the surface and thereby avoid drying slurry on the surface.
申请公布号 US6375544(B1) 申请公布日期 2002.04.23
申请号 US19990258744 申请日期 1999.02.26
申请人 发明人
分类号 B24B37/04;(IPC1-7):B24B1/00 主分类号 B24B37/04
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