| 摘要 |
PROBLEM TO BE SOLVED: To provide an easily adaptable technique even in the case that cycle displacements occur in the output data of a device to be measured without rewriting a test pattern. SOLUTION: Cycle shift parts 5 are each provided in signal paths in which an expected value pattern S2 is inputted to each of a timing generating device 3 and a logic comparing circuit 2 from a timing generating part 1, and the expected value pattern is shifted by the same number of cycles according to the cycle displacements of a DUT at each cycle shift part 5.
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