发明名称 ABNORMALITY DETECTING MECHANISM
摘要 <p>PROBLEM TO BE SOLVED: To average currents supplied to a module, and to easily detect any abnormality generated in a module. SOLUTION: At the time of supplying currents from a computer main body to a module 1, currents to be supplied are dispersed through semiconductor switches 4-1-4-3, and the states of the respective semiconductor switches 4-1-4-3 are monitored by abnormality detecting circuits 5-1-5-3. When the abnormality of the semiconductor switches 4-1-4-3 is detected by the abnormality detecting circuits 5-1-5-3, a controller 6 is informed of the detection signal.</p>
申请公布号 JP2002116847(A) 申请公布日期 2002.04.19
申请号 JP20000305966 申请日期 2000.10.05
申请人 TOSHIBA CORP 发明人 MORIYA AKIHIRO
分类号 G06F1/26;G06F13/00;(IPC1-7):G06F1/26 主分类号 G06F1/26
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