| 摘要 |
PROBLEM TO BE SOLVED: To provide a measuring circuit, which can be utilized for testing performance of a sense amplifier incorporated in the inside of a semiconductor integrated circuit device from the outside. SOLUTION: This device has a delay time measuring circuit provided with a first input terminal receiving an external signal, a second input terminal receiving a first control signal, a third input terminal receiving a second control signal, a second selection circuit outputting an external signal to an input node of a sense amplifier based on the second control signal, a bypass line connecting the input node of the sense amplifier to an output node, a first control circuit transmitting the input node signal of the sense amplifier to an output node from an input node via the bypass line, based on the first control signal, and an output terminal outputting an output node signal of the sense amplifier to the outside.
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