发明名称 METHOD FOR MEASURING WITH X-RAY AND X-RAY DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an X-ray device of a type cooling both a sample and an X-ray detector capable of reducing the running cost saving the electric power and to facilitating the maintenance. SOLUTION: This method for measuring with X-rays includes supplying cold air to the sample S by means of a cooling gas supply device 17, irradiating the sample S with X-rays while cooling a CCD X-ray detector 26, and detecting, using the CCD X-ray detector 26, the X-rays exiting the sample S. A Peltier element 27 is cooled by a heat exchanger 28 by use of the cold air supplied to the sample S and the X-ray detector 26 is cooled by the Peltier element 27 to prevent thermal noises at the X-ray detector 26.</p>
申请公布号 JP2002116158(A) 申请公布日期 2002.04.19
申请号 JP20000305845 申请日期 2000.10.05
申请人 RIGAKU CORP 发明人 OGISO KATSUHIKO
分类号 G01N23/20;G01T1/20;G01T7/00;(IPC1-7):G01N23/20 主分类号 G01N23/20
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