发明名称 |
METHOD FOR FABRICATING DYNAMIC RANDOM ACCESS MEMORY |
摘要 |
PURPOSE: A method for fabricating a dynamic random access memory(DRAM) is provided to reduce a burden of an annealing process in forming a polysilicon layer and to decrease interfacial resistance between the polysilicon layers, by simultaneously forming a plug having the same material as a stud when a storage contact of the same as or similar to the level of the stud is formed. CONSTITUTION: A bit line(19) and a bit line contact(17) are formed on a substrate(10) where an interlayer dielectric(13) is stacked on the structure of a metal oxide semiconductor(MOS) transistor. An interlayer dielectric(20) is stacked on the bit line. The interlayer dielectric is selectively etched to form a storage node contact hole and a stud hole. A conductive layer is stacked while the contact hole and the stud hole are formed, so that a contact plug and the stud are simultaneously formed.
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申请公布号 |
KR20020029713(A) |
申请公布日期 |
2002.04.19 |
申请号 |
KR20000060336 |
申请日期 |
2000.10.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, YEONG U |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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