发明名称 APPARATUS FOR CONTROLLING OXYGEN QUANTITY MIXED IN POLYSILICON FILM IN TREATING SILICON FILM BY EXCIMER LASER
摘要 <p>PROBLEM TO BE SOLVED: To keep oxygen content under a specified threshold by efficiently controlling the oxygen quantity mixed in a polysilicon film annealed by excimer- laser annealed. SOLUTION: This laser-annealing apparatus for treating a semiconductor material, having a surface is provided with (a) a laser which directs the beam to a position on the surface of the semiconductor material, and (b) a nozzle which feeds gas flow to the position on the surface of the semiconductor material for removing surrounding air from the position to which the beam has been directed. A kit for modifying existing laser-annealing equipment is provided, with (a) at least a nozzle that excludes surrounding air from the target area, to which the laser beam is directed so as to anneal the target material.</p>
申请公布号 JP2002118076(A) 申请公布日期 2002.04.19
申请号 JP20010247118 申请日期 2001.08.16
申请人 SHARP CORP 发明人 APOSTLOS BOUTOSASU
分类号 H01L21/20;B23K26/14;H01L21/268;(IPC1-7):H01L21/268 主分类号 H01L21/20
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