| 摘要 |
PURPOSE: A calibration kit for transistor test is provided, which measures an electrical characteristics of a transistor chip accurately by connecting an impedance component which compensates for an impedance as to a distance between the transistor chip and an input/output port of a test kit when the transistor chip is smaller than the test kit. CONSTITUTION: An impedance component(41), which compensates for a path impedance with a test kit according to a size of a transistor chip(3), is connected in the inside of a body(4) to have the transistor chip be built in. After installing the body of a calibration kit to a test kit(2) connected to a network analyzer, the transistor chip is embedded in the body. The impedance component measures an electrical characteristics of the transistor chip accurately. Because the impedance component has an impedance value set through an experiment according to a size of the transistor chip, the calibration kit has to be replaced with a new calibration kit where an impedance component having an impedance value appropriate to the size of the transistor chip whenever the size of the transistor chip is varied.
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