发明名称 |
DEPOSITED THIN FILM VOID-COLUMN NETWORK MATERIALS |
摘要 |
<p>A novel porous film (3) is disclosed comprising a network of silicon columns in a continuous void which may be fabricated using high density plasma deposition at low temperatures, i.e., less than about 250 DEG C. This silicon film is a two-dimensional nano-sized array of rodlike columns. This void-column morphology can be controlled with deposition conditions and the porosity can be varied up to 90 %. The simultaneous use of low temperature deposition and etching in the plasma approach utilized, allows for the unique opportunity of obtaining columnar structure, a continuous void, and polycrystalline column composition at the same time. Unique devices may be fabricated using this porous continuous film by plasma deposition of this film on a glass, metal foil, insulator or plastic substrates (5).</p> |
申请公布号 |
WO0074932(A9) |
申请公布日期 |
2002.04.18 |
申请号 |
WO2000US14862 |
申请日期 |
2000.05.30 |
申请人 |
THE PENN STATE RESEARCH FOUNDATION;FONASH, STEPHEN, J.;KALKAN, ALI, KAAN;BAE, SANGHOON |
发明人 |
FONASH, STEPHEN, J.;KALKAN, ALI, KAAN;BAE, SANGHOON |
分类号 |
B81B3/00;B81C1/00;C23C16/24;C23C16/511;G01N21/17;G01N27/12;G01N27/447;H01J49/04;H01J49/16;(IPC1-7):B32B3/10;H05H1/02;C23C10/06;C23C16/06 |
主分类号 |
B81B3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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