发明名称 Photosensitive laminate, process for forming resist pattern using same and positive resist compostion
摘要 A photosensitive laminate includes a substrate and a resist layer 500 to 5800 angstroms thick formed on the substrate. A composition for the resist layer includes (A) a compound which generates an acid upon irradiation with radioactive ray, (B) an alkali-soluble novolak resin, and (C) a compound having at least one acid-decomposable dissolution-inhibiting group, and the dissolution-inhibiting group is decomposable by action of an acid generated from the ingredient (A) to yield an organic carboxylic acid. This photosensitive laminate is sequentially subjected to selective exposure to KrF excimer laser light or to light having a short wavelength equal to or less than that of F2 laser, post-exposure baking, and developing with an alkali to yield a resist pattern.
申请公布号 US2002045123(A1) 申请公布日期 2002.04.18
申请号 US20010799549 申请日期 2001.03.07
申请人 OKUBO WAKI;SATO KAZUFUMI;NITTA KAZUYUKI;OGATA TOSHIYUKI 发明人 OKUBO WAKI;SATO KAZUFUMI;NITTA KAZUYUKI;OGATA TOSHIYUKI
分类号 G03F7/004;G03F7/039;(IPC1-7):G03F7/039;G03F7/30 主分类号 G03F7/004
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