发明名称 DEEP GRAYSCALE ETCHING OF SILICON
摘要 Curved structures are etched into silicon suitable for utilization in meso-machines. The curved structures are obtained by patterning photoresist using gray scale technology, followed by an ICP-machining process of alternating sequential etching and polymerization steps. The curved structures can also be obtain using a two step etching process where the gray scale patterned photoresist is first etched using reactive ion etching (RIE), followed by ICP machining by alternating sequential etching and polymerization steps.
申请公布号 WO0231600(A1) 申请公布日期 2002.04.18
申请号 WO2001US42629 申请日期 2001.10.10
申请人 MEMS OPTICAL, INC.;WHITLEY, MICHAEL, RAY;CLARK, RODNEY, L.;SHAW, RUSSELL, JAY;BROWN, DAVID, RENICK;ERBACH, PETER, SCOTT;BOREK, GREGG, T. 发明人 WHITLEY, MICHAEL, RAY;CLARK, RODNEY, L.;SHAW, RUSSELL, JAY;BROWN, DAVID, RENICK;ERBACH, PETER, SCOTT;BOREK, GREGG, T.
分类号 G02B6/12;G02B6/36;G03F7/40;(IPC1-7):G03F7/36;B44C1/22 主分类号 G02B6/12
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