发明名称 Exposure apparatus and its control method, stage apparatus, and device manufacturing method
摘要 Accurate alignment can be attained irrespective of strains of the main body structure. An exposure apparatus, which has a substrate stage (13, 15) which holds and moves a substrate (18), a position measurement unit (14) for measuring the position of the substrate stage, and a control unit (16) for performing drive control of the substrate stage to align the substrate on the basis of the measured position, and which aligns the substrate and a master plate (2), and forms a pattern on the master plate on the substrate by exposure, has a strain measurement unit (9) for measuring strain of a structure (8) to which the position measurement unit is fixed, and the control unit aligns the substrate by the drive control of the stage in consideration of the measured strain.
申请公布号 US2002044269(A1) 申请公布日期 2002.04.18
申请号 US20010983483 申请日期 2001.10.24
申请人 YONEKAWA MASAMI;FUKAGAWA YOZO 发明人 YONEKAWA MASAMI;FUKAGAWA YOZO
分类号 G03F7/20;(IPC1-7):G03B27/42 主分类号 G03F7/20
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