发明名称 Pattern forming apparatus and pattern forming method
摘要 A pattern forming apparatus for forming a pattern on a substrate comprising a first exposure section capable of pattern exposure for a predetermined line width, a second exposure section for conducting pattern exposure for a line width greater than the predetermined line width of the first exposure section, and a means for detecting the relative positional relationship between the first exposure section and the second exposure section, wherein pattern exposure is conducted by using the first exposure section and the second exposure section on the basis of the detected positional relationship.
申请公布号 US2002044268(A1) 申请公布日期 2002.04.18
申请号 US20010971663 申请日期 2001.10.09
申请人 YAMAGUCHI TAKAKO;KURODA RYO 发明人 YAMAGUCHI TAKAKO;KURODA RYO
分类号 G03B27/42;G03F7/20;G03F9/00;H01L21/027;(IPC1-7):G03B27/42 主分类号 G03B27/42
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