发明名称 METHOD FOR DRY-ETCHING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for dry-etching a semiconductor device is provided to minimize particles generated on a wafer where an etch process is performed, by making radio frequency(RF) power not turn off until a dry etch process is completed. CONSTITUTION: A semiconductor wafer having a multilayer is transferred to an etch chamber. A predetermined portion of an uppermost layer of the multilayer is etched to form an opening. A stabilization process is performed regarding a chamber while RF power is applied to the etch chamber. A lower layer exposed to a lower portion by the opening is over-etched.
申请公布号 KR20020028457(A) 申请公布日期 2002.04.17
申请号 KR20000059480 申请日期 2000.10.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, MIN JE;YOON, SEOK HUN
分类号 H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/3065
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