发明名称 |
METHOD FOR DRY-ETCHING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for dry-etching a semiconductor device is provided to minimize particles generated on a wafer where an etch process is performed, by making radio frequency(RF) power not turn off until a dry etch process is completed. CONSTITUTION: A semiconductor wafer having a multilayer is transferred to an etch chamber. A predetermined portion of an uppermost layer of the multilayer is etched to form an opening. A stabilization process is performed regarding a chamber while RF power is applied to the etch chamber. A lower layer exposed to a lower portion by the opening is over-etched.
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申请公布号 |
KR20020028457(A) |
申请公布日期 |
2002.04.17 |
申请号 |
KR20000059480 |
申请日期 |
2000.10.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, MIN JE;YOON, SEOK HUN |
分类号 |
H01L21/3065;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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