发明名称 |
METHOD FOR FABRICATING JUNCTION PART OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a junction part of a semiconductor device is provided to maximize activation of impurity ions by increasing a possibility that the impurity ions return to their positions. CONSTITUTION: The first impurity ion implantation process is performed regarding a semiconductor substrate(201) wherein a spacer(206) is formed on the sidewall of a gate electrode so that an amorphous layer is formed. The second impurity ion implantation process is performed to form the junction part(208) on the semiconductor substrate. The first heat treatment process is performed to grow the amorphous layer of a solid type. The second heat treatment process of which the temperature is increased is performed to activate the junction part.
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申请公布号 |
KR20020028489(A) |
申请公布日期 |
2002.04.17 |
申请号 |
KR20000059512 |
申请日期 |
2000.10.10 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HONG, BYEONG SEOP;OH, JAE GEUN |
分类号 |
H01L21/265;(IPC1-7):H01L21/265 |
主分类号 |
H01L21/265 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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