Method of testing and mounting devices using a resilient contact structure

摘要

A method of connecting to a semiconductor device comprises the steps of permanently mounting a plurality of elongate electrical contact structures (1330) to a semiconductor device (1302), the semiconductor device comprising at least one die; urging the semiconductor device against a first electronic component (1310) to effect a temporary connection between the semiconductor device and the first electronic component, with the electrical contact structures serving as electrical interconnects between the semiconductor device and the first electronic component; and using at least a plurality of the same electrical contact structures mounted to the semiconductor device to effect a permanent connection between at least one die of the semiconductor device and a second electronic component.