HORIZONTAL DEVICE TEST HANDLER AND OPERATION METHOD THEREOF

摘要

PURPOSE: A horizontal device test handler and an operation method thereof are provided, which reduces the number of pick and place epochally, and minimizes a damage of a device and reduces an index time, and performs a room temperature and a high temperature test. CONSTITUTION: A loading part(10), where trays(11) filled with devices to be tested, is installed in one side of a front part of a base(1) of a handler. And an unloading part(20) comprising a number of good devices loading trays(21) and retest device loading trays(22) where devices classified as good devices and retest devices among the devices whose tests are completed are loaded respectively is installed on both sides of the loading part. And a number of failed devices loading trays(23) loaded with failed devices are comprised in another side of the front of the base. Each tray of the loading part and the unloading part is moved front and back on the base of the handler. And a loading shuttle(51) divided into a number of sections is comprised on a center of the base.