发明名称 METHOD FOR LASER BEAM MARKING ON SEMICONDUCTOR PACKAGE
摘要 <p>PROBLEM TO BE SOLVED: To improve the visibility of a laser beam marking. SOLUTION: The method for laser beam marking, by which the marking on the surface of a semiconductor package 1 is performed by irradiating the surface of the semiconductor package 1 with a laser beam, is composed of a process where a white or light-colored coating 3 is formed on the surface of the semiconductor package 1, a process where a blank or thick-colored coating 4 is formed on the white or light-colored coating 3, and a process where a desired part of the coating 4 is removed by irradiating the black or thick- colored coating 4 with the laser beam and the white or light-colored coating 3 existing as an under-layer of the black or thick-colored coating 4 is exposed, thus a marking on the semiconductor package 1 is performed.</p>
申请公布号 JP2002113584(A) 申请公布日期 2002.04.16
申请号 JP20000306672 申请日期 2000.10.05
申请人 DENSO CORP 发明人 ONO MAKOTO
分类号 B23K26/00;B23K101/40;H01L23/00;H01L23/28;(IPC1-7):B23K26/00 主分类号 B23K26/00
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