发明名称 Etch stops and alignment marks for bonded wafers
摘要 There is described a method of making a bonded wafer by diffusing regions of a first wafer proximate a first major surface. Trenches are etched a predetermined distance into the first wafer from the first major surface toward a second major surface. The first major surface and trenches are coated with oxide. The first major surface of the first wafer is bonded to a second wafer to form a bonded wafer. The second major surface of the bonded wafer which is also the second major surface of the first wafer is ablated until oxide in the trenches is detected. The bonded wafer is cut into chips which are packaged as integrated circuits.
申请公布号 US6372600(B1) 申请公布日期 2002.04.16
申请号 US19990385735 申请日期 1999.08.30
申请人 AGERE SYSTEMS GUARDIAN CORP. 发明人 DESKO JOHN CHARLES;SHIBIB MUHAMMED AYMAN
分类号 H01L21/76;H01L21/02;H01L21/20;H01L21/306;H01L21/3065;H01L21/66;H01L21/762;H01L23/544;H01L27/12;(IPC1-7):H01L21/76 主分类号 H01L21/76
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