发明名称 Cantilever magnetic force sensor for magnetic force microscopy and method of manufacturing magnetic force sensor
摘要 A magnetic force sensor detects a magnetic force of a magnetic sample having a given magnetization direction. The magnetic force sensor comprises a magnetic probe having a tip portion. The tip portion has an electrolytically plated film of hard-magnetic material effective to maintain the magnetization direction of the probe constant and parallel to the given magnetization direction of the sample.
申请公布号 US6373246(B1) 申请公布日期 2002.04.16
申请号 US20000559376 申请日期 2000.04.27
申请人 SEIKO INSTRUMENTS INC. 发明人 TOMITA EISUKE;MORIYA NAOTO
分类号 G01R33/02;G01Q60/08;G01Q60/40;G01Q60/54;G01Q60/56;G01R33/038;G01R33/10;G01R33/12;G11B5/00;G11B11/105;G11B19/02;H01F10/16;H01J37/28;(IPC1-7):G01R33/02 主分类号 G01R33/02
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