发明名称 |
Cantilever magnetic force sensor for magnetic force microscopy and method of manufacturing magnetic force sensor |
摘要 |
A magnetic force sensor detects a magnetic force of a magnetic sample having a given magnetization direction. The magnetic force sensor comprises a magnetic probe having a tip portion. The tip portion has an electrolytically plated film of hard-magnetic material effective to maintain the magnetization direction of the probe constant and parallel to the given magnetization direction of the sample.
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申请公布号 |
US6373246(B1) |
申请公布日期 |
2002.04.16 |
申请号 |
US20000559376 |
申请日期 |
2000.04.27 |
申请人 |
SEIKO INSTRUMENTS INC. |
发明人 |
TOMITA EISUKE;MORIYA NAOTO |
分类号 |
G01R33/02;G01Q60/08;G01Q60/40;G01Q60/54;G01Q60/56;G01R33/038;G01R33/10;G01R33/12;G11B5/00;G11B11/105;G11B19/02;H01F10/16;H01J37/28;(IPC1-7):G01R33/02 |
主分类号 |
G01R33/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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