| 摘要 |
A connector testing system includes a connector having a top section and a housing having a test channel formed therein, an electrically conductive terminal strip disposed within the connector, a portion of the terminal strip disposed within the test channel, and a bridge clip having a body and a test probe connected thereto. The test probe can include an outer surface having a projection and a probe section that is guided by the test channel to the terminal strip when the test probe is inserted into the test channel. The top section of the connector has a shoulder sized and shaped to accept the projection and the connector including a side wall having a guiding portion sized and shaped to contact the probe section when the test probe is inserted into the test channel.
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