发明名称 Physical vapor deposition device for forming a metallic layer on a semiconductor wafer
摘要 The present invention provides a physical vapor deposition device for forming a metallic layer with a predetermined thickness on a semiconductor wafer. The PVD device comprises a chamber, a wafer chuck installed at the bottom end of the chamber through which the semiconductor wafer is hold horizontally, a metallic ion generator for generating metallic ions, an electric field generator for forming a vertical electric field above the wafer chuck that guides the metallic ions toward the wafer chuck, and a magnetic field generator. The magnetic field generator generates a magnetic field perpendicular to the direction of movement of the metallic ions to create a horizontal moving force on the metallic ions thus causing the metallic ions to deposit on the semiconductor wafer at a slant angle.
申请公布号 US6371045(B1) 申请公布日期 2002.04.16
申请号 US19990360627 申请日期 1999.07.26
申请人 UNITED MICROELECTRONICS CORP. 发明人 WANG KUN-CHIH;HSIEH CHAO-CHING
分类号 C23C14/04;C23C14/16;C23C14/35;H01J37/34;(IPC1-7):C23C16/00 主分类号 C23C14/04
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