发明名称 |
Physical vapor deposition device for forming a metallic layer on a semiconductor wafer |
摘要 |
The present invention provides a physical vapor deposition device for forming a metallic layer with a predetermined thickness on a semiconductor wafer. The PVD device comprises a chamber, a wafer chuck installed at the bottom end of the chamber through which the semiconductor wafer is hold horizontally, a metallic ion generator for generating metallic ions, an electric field generator for forming a vertical electric field above the wafer chuck that guides the metallic ions toward the wafer chuck, and a magnetic field generator. The magnetic field generator generates a magnetic field perpendicular to the direction of movement of the metallic ions to create a horizontal moving force on the metallic ions thus causing the metallic ions to deposit on the semiconductor wafer at a slant angle.
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申请公布号 |
US6371045(B1) |
申请公布日期 |
2002.04.16 |
申请号 |
US19990360627 |
申请日期 |
1999.07.26 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
WANG KUN-CHIH;HSIEH CHAO-CHING |
分类号 |
C23C14/04;C23C14/16;C23C14/35;H01J37/34;(IPC1-7):C23C16/00 |
主分类号 |
C23C14/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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