发明名称 ELECTRON BEAM EXPOSURE ALIGNER FOR DRAWING MASK
摘要 PROBLEM TO BE SOLVED: To provide an electron beam drawing apparatus capable of providing a fine pattern when the patterns are aligned on a mask blank, and to provide a mask having the fine pattern. SOLUTION: The electron beam drawing apparatus for drawing a lithographic mask comprises an electron gun for emitting electrons for alignment, an electron optic system for converging and emitting the emitted electrons on the mask blank, and a holder stage for holding and moving the blank. The apparatus further comprises a means for suppressing the reflection of the electron beam from the holder stage or an influence of the reflection.
申请公布号 JP2002110537(A) 申请公布日期 2002.04.12
申请号 JP20010148877 申请日期 2001.05.18
申请人 NIKON CORP 发明人 SUGANUMA WAKAKO;SHIMIZU SUMUTO;YAMADA ATSUSHI;SUZUKI SHOHEI;YAMAMOTO HAJIME
分类号 G03F1/20;G03F7/20;H01J37/20;H01J37/305;H01J37/317;H01L21/027 主分类号 G03F1/20
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