发明名称 INTEGRATED SEMICONDUCTOR CIRCUIT
摘要 PROBLEM TO BE SOLVED: To solve the problem difficulty in reducing leakage current when a circuit is operated. SOLUTION: Each of low leakage combination circuits 11 and 12 has a logic circuit having a transistor of a low threshold voltage and a transistor to be turned on, off in response to a control signal to the logic circuit. In this case, only when flip-flops 13 and 14 connected to the output terminals of the circuits 11 and 12 fetch data in response to control signals EN1 and EN2, the circuits 11 and 12 become active by the signals EN1 and EN2. Accordingly, power is supplied to the circuits 11 and 12, only when data are output. However, the powers is not supplied, in other cases, and hence the leakage current can be reduced.
申请公布号 JP2002110920(A) 申请公布日期 2002.04.12
申请号 JP20000295234 申请日期 2000.09.27
申请人 TOSHIBA CORP;TOSHIBA MICROELECTRONICS CORP 发明人 FURUSAWA TOSHIYUKI;SONODA HIROSHI;ZAMA HIDETADA;KOIZUMI MASAYUKI;USAMI MASAYOSHI;KANAZAWA MASAHIRO;KAWABE NAOYUKI
分类号 H01L21/822;H01L27/04;H03K19/00;(IPC1-7):H01L27/04 主分类号 H01L21/822
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