发明名称 SEMICONDUCTOR SUBSTRATE AND MANUFACTURING METHOD THEREFOR
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor substrate together with its manufacturing method which provides full gettering ability. SOLUTION: The semiconductor substrate comprises a region 32, which comprises voids functioning as a gettering site at a density of 108 pieces/cm3 or more. The size of the void is preferably 10 nm-0.5μm as the diameter of a ball, having the same volume as that of the void.
申请公布号 JP2002110684(A) 申请公布日期 2002.04.12
申请号 JP20000293934 申请日期 2000.09.27
申请人 TOSHIBA CORP 发明人 SEKIHARA AKIKO;MIYASHITA MORIYA
分类号 H01L21/322;H01L21/02;H01L27/12;(IPC1-7):H01L21/322 主分类号 H01L21/322
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