发明名称 |
SEMICONDUCTOR SUBSTRATE AND MANUFACTURING METHOD THEREFOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor substrate together with its manufacturing method which provides full gettering ability. SOLUTION: The semiconductor substrate comprises a region 32, which comprises voids functioning as a gettering site at a density of 108 pieces/cm3 or more. The size of the void is preferably 10 nm-0.5μm as the diameter of a ball, having the same volume as that of the void.
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申请公布号 |
JP2002110684(A) |
申请公布日期 |
2002.04.12 |
申请号 |
JP20000293934 |
申请日期 |
2000.09.27 |
申请人 |
TOSHIBA CORP |
发明人 |
SEKIHARA AKIKO;MIYASHITA MORIYA |
分类号 |
H01L21/322;H01L21/02;H01L27/12;(IPC1-7):H01L21/322 |
主分类号 |
H01L21/322 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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