发明名称 APPARATUS AND METHOD OF CLEANING WAFERS AFTER WIRE SAW
摘要 PROBLEM TO BE SOLVED: To provide an apparatus and method for cleaning wafers after wire saw, which can provide a uniform gap between the wafers and can enhance a wafer cleaning effect, by injecting a vapor of a mixture of a cleaning solution and a gas or a vapor of the cleaning solution into gaps between the wafers. SOLUTION: In an apparatus 10 for cleaning wafers after wire saw, a plurality of wafers 16 formed by slicing an ingot 11 held in a holding base 13 in a direction crossed by an axial line into thin plates are cleaned while held in the holding base 13. The ingot 11 is held in a gas atmosphere. The apparatus includes nozzles 27 for injecting a mixture of a cleaning solution and a gas into gaps G between the wafers 16 and a movement means 25 for changing a relative position between the nozzles 27 and wafers 16 in the axial line direction, and cleans the wafers 16 by the injection of the mixture.
申请公布号 JP2002110591(A) 申请公布日期 2002.04.12
申请号 JP20000294764 申请日期 2000.09.27
申请人 TAKATA CORP 发明人 MORI NOBUHIRO;TOKO TAKANORI;KINOSHITA MITSUMORI;ANO KOICHIRO
分类号 B08B3/02;H01L21/304;(IPC1-7):H01L21/304 主分类号 B08B3/02
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