发明名称 METHOD AND APPARATUS FOR CLEANING SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To clean a semiconductor wafer without having to use harmful chemical liquid, such as a pyranner and an organic solvent. SOLUTION: Ultra pure water is heated for generating vapor, and the vapor is sprayed onto the surface of the semiconductor wafer at a temperature of 85 deg.C or higher. Even though the vapor is sprayed with a low pressure of 4.5 kg/cm2 or lower, photoresist or organic matters is removed from the surface of the semiconductor wafer.
申请公布号 JP2002110611(A) 申请公布日期 2002.04.12
申请号 JP20000304638 申请日期 2000.10.04
申请人 TEXAS INSTR JAPAN LTD 发明人 TSUGA TOMOHITO
分类号 H01L21/304;B08B3/02;H01L21/00;(IPC1-7):H01L21/304 主分类号 H01L21/304
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