DEVICE FOR AUTOMATICALLY TESTING HIGH-SPEED INTEGRATED CIRCUITS AND METHOD FOR THE SAME

摘要

PURPOSE: A device for automatically testing high-speed integrated circuits and method for the same are provided to output data to be sampled at very high frequencies in comparison with a conventional device in an automatic test equipment(ATE). CONSTITUTION: A device(10) for automatically testing high-speed integrated circuits includes a high speed data source(14) for supplying a test signal to an integrated circuit device under test(11), relays selectively connecting the DUT, output elements(15) coupled to receive input data pulses from the relays and to deliver data impulses to a number of locking circuits(17a-17d) and a sampling element associated with each locking circuit(17a-17d). The sampling element permits each locking element to transfer data pulses from its input to its output.