发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which reduces the concentration of stress on a bonding member connecting a semiconductor chip and a conductor member due to thermal stress. SOLUTION: An E heat sink 3 is bonded by solder to the top surfaces 1a and 2a of semiconductor chips 1 and 2, a 2nd conductor 5 is bonded by solder 4 to the backsides 1b and 2b, and a 3rd conductor member 6 is bonded by solder to the top surface 3a of the E heat sink 3. The E heat sink 3 is provided with a step part 3c to have a thin part 3d, and the bonding area between the E heat sink 3 and 3rd semiconductor member 6 is smaller than that between the E heat sink 3 and semiconductor chips 1 and 2. The respective members 1 to 8 are sealed with resin so that the backside 5b of the 2nd conductor member 5 and the top surface 6a of the 3rd conductor member 6 are exposed.
申请公布号 JP2002110893(A) 申请公布日期 2002.04.12
申请号 JP20000305228 申请日期 2000.10.04
申请人 DENSO CORP 发明人 FUKUDA YUTAKA;NAKASE YOSHIMI;MASAMITSU KUNIAKI;MAKINO TOMOATSU
分类号 H01L23/29;H01L23/36;H01L25/04;H01L25/07;H01L25/18 主分类号 H01L23/29
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