发明名称 PLASMA TREATMENT DEVICE AND PLASMA TREATMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide a plasma treatment device which can reduce charged-up damages on a semiconductor chip during plasma treatment, depending on the composition of plasma generation gas. SOLUTION: A tubular reaction tube 7 is formed of a dielectric material and one side of the reaction tube 7 is opened as a slit-like blow-off port 12. A plurality of electrodes 9, 10 are disposed outside the reaction tube 7. Plasma generating gas 8, containing rare gas and oxygen gas, is introduced to the reaction tube 7, and a voltage is applied between the electrodes 9, 10, thus generating discharge inside the reaction tube 7 under a pressure of atmosphere or thereabout. The plasma treatment device blows off plasma 13 generated inside the reaction tube 7 from the blow-off port 12 by discharging. The mixing ratio of oxygen gas in the plasma generating gas 8 is set to 2 to 5 vol.%. Electrons generated in the plasma 13 are made to be extinguished by adsorption by oxygen gas.
申请公布号 JP2002110639(A) 申请公布日期 2002.04.12
申请号 JP20000293043 申请日期 2000.09.26
申请人 MATSUSHITA ELECTRIC WORKS LTD 发明人 YASUDA MASAHARU;SAWADA KOJI
分类号 H05H1/24;H01L21/302;H01L21/304;H01L21/3065 主分类号 H05H1/24
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