发明名称 Method of using a specimen sensing end effector to determine the thickness of a specimen
摘要 Robot arm (16) end effectors (10, 110, 210) of this invention rapidly and cleanly transfer semiconductor wafers (12) between a wafer cassette (14) and a processing station. The end effectors include fiber optic light transmission sensors (90, 102, 202, 214) for determining various wafer surface, edge, thickness, tilt, and location parameters. The sensors provide robot arm extension and elevation positioning data supporting methods of rapidly and accurately placing and retrieving a wafer from among a stack of closely spaced wafers stored in the wafer cassette. The methods effectively prevent accidental contact between the end effector and the wafers while effecting clean, secure gripping of the wafer.
申请公布号 US2002042666(A1) 申请公布日期 2002.04.11
申请号 US20010920353 申请日期 2001.08.01
申请人 BACCHI PAUL;FILIPSKI PAUL S. 发明人 BACCHI PAUL;FILIPSKI PAUL S.
分类号 B25J15/08;B65G49/07;H01L21/677;H01L21/683;(IPC1-7):G05B15/00 主分类号 B25J15/08
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