| 摘要 |
The invention disclosed herein is a system and method for testing integrated circuit devices, including memory chips. The devices under test are subject to behavioural testing, in which a copy of signals in an application system is directed to the device under test, or to an electronic component connected to the device under test. This permits the device under test to be tested under the operating conditions of the application system, which is preferably similar to the actual application environment in which the device under test will ultimately be used. Conventional tests, including pattern testing and/or parametric tests, may also be performed on devices under test, if desired. |
