INSPECTION METHOD AND INSPECTION DEVICE FOR SCANNING OPTICAL SYSTEM

摘要

PROBLEM TO BE SOLVED: To inspect the defect of a scanning optical system in the single state before integration into a device. SOLUTION: This device comprises a white reflector 61 with uniform reflecting intensity arranged over the whole length of the main scanning range of laser beam L emitted from the scanning optical system 10; an optical guide 62 having an incident end surface extending over the whole length of the main scanning line range on the white reflector 61 and an outgoing end surface connected to the light incident surface of a PMT 63; the PMT 63 for photoelectrically detecting the intensity of the reflected laser beam L that is the reflected light by the reflector 61 of the laser beam L; and a defect detecting means 66 for detecting the defect of an optical element constituting the scanning optical system 10 for the main scanning range on the basis of the intensity of the reflected laser beam L conformed to the main scanning position of the laser beam L.