发明名称 DEVICE AND METHOD FOR TESTING CONTROLLER
摘要 <p>PROBLEM TO BE SOLVED: To shorten the time before all tests are completed after the test of a controller is started. SOLUTION: The testing device of the controllers 10 conducts the test of the time constant of the controllers 10 controlling a unit to be controlled with the time constant based on the process value of the unit to be controlled. The device is provided with a plurality of test signal input means 7 inputting test signals to the controllers 10, a plurality of response signal receiving means 8 receiving respective response signals outputted with respect to the test signals inputted to the controllers 10 by the respective test signal input means 7 from the respective controllers 10, a plurality of response signal analyzing means 11 analyzing the respective response signals based on the response signals received by the respective response signal receiving means 8 and a judging means 11 judging the normality/abnormality of the controllers 10 being the output sources of the respective response signals based on an analysis result analyzed by the respective response signal analyzing means 11.</p>
申请公布号 JP2002108443(A) 申请公布日期 2002.04.10
申请号 JP20000305140 申请日期 2000.10.04
申请人 MITSUBISHI HEAVY IND LTD 发明人 NAKAGAWA MASATO;TAKAYAMA MASAFUMI;NAKANO YASUKAZU
分类号 G01D21/00;G05B23/02;(IPC1-7):G05B23/02 主分类号 G01D21/00
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