发明名称 Modified design representation for fast fault simulation of an integrated circuit
摘要 A system and method perform a two-pass fault simulation on an original design representation including a software-modeled design element and a hardware-modeled design element. Logic simulation generates input stimulus for a port on the boundary of the software-modeled design element and the hardware-modeled design element, where such ports are output ports of the software-modeled design element and input ports of the hardware-modeled design element. The input stimulus is merged with test patterns for the original design representation. A modified design representation is generated by replacing the software-modeled design element with a nonfunctional block. Most or all possible faults in the hardware-modeled design representation are seeded. The modified design representation is fault simulated in a first pass using the merged input stimulus and test patterns. Any unseeded faults from the first pass and other possible faults in the software-modeled design representation are then seeded and the original design representation is fault simulated in a second pass. The fault coverage results of the two passes are aggregated to generate an overall fault coverage for the original design representation.
申请公布号 US6370492(B1) 申请公布日期 2002.04.09
申请号 US19980207878 申请日期 1998.12.08
申请人 LSI LOGIC CORPORATION 发明人 AKIN MICHELLE R.
分类号 G06F9/45;G06F11/26;G06F17/50;(IPC1-7):G06F17/50 主分类号 G06F9/45
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