发明名称 Detection of flux residue
摘要 Detection of flux residue remaining the formation of a device/substrate assembly is carried out by contacting the assembly with a fixed amount of solvent adapted to remove residual flux from the assembly and measuring the conductivity or resistance of the contacted solvent to determine the presence of flux residue in the solvent obtained from the assembly. Embodiments include contacting the assembly with isopropanol by immersing and withdrawing the assembly in a fixed amount of the solvent and measuring the conductivity of the contacted solvent with a volt meter.
申请公布号 US6367679(B1) 申请公布日期 2002.04.09
申请号 US20000642831 申请日期 2000.08.22
申请人 ADVANCED MICRO DEVICES, INC. 发明人 MASTER RAJ N.;HALDERMAN JONATHAN D.
分类号 B23K3/02;H05K3/26;(IPC1-7):B23K31/12 主分类号 B23K3/02
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