| 摘要 |
Test adapter for testing a loaded circuit board (6), comprising a probe plate (1), on which test probes (3) for the contact of plungers of the test probes (3a) with test points (7) of the circuit board (6) are fixed, and a moving plate (4), with which the circuit board (6) can be coupled by means of locating pins (5), that is arranged between the circuit board (6) and the probe plate (1) and having through bores (8) for the test probes (3). The test adapter further comprises an adjusting device (50-65), by means of which the position of the circuit board (6) is adjustable with regard to the plunger positions of the test probes (3). With a movement of the probe plate (1) towards the circuit board (6), the plungers of the test probes (3) meet the test points on the circuit board (6), and the adjusting device (50-65) affects each locating pin (5) and establishes adjustably the locating pins (5) in the moving plate (4) in a plane parallel to the plane of the circuit board.
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