发明名称 DRY CHEMICAL MECHANICAL POLISHING METHOD
摘要 <p>PROBLEM TO BE SOLVED: To efficiently carry out etching. SOLUTION: In this method for planarizing a surface of a sample to be polished, the surface of the sample 107 held in a sample base 114 is brought into contact with a polishing pad 119 while supplying a plasma 106 from a plasma source, and polishing is carried out by moving a relative position between the sample 107 and a polishing tool 119. The dry chemical mechanical polishing method is constituted such that, at polishing, a diameter of the sample 107 is made larger than that of the polishing tool 119 thereby exposing at least a part of the surface of the sample to an atmosphere of the plasma 106.</p>
申请公布号 JP2002103207(A) 申请公布日期 2002.04.09
申请号 JP20000299105 申请日期 2000.09.27
申请人 HITACHI LTD 发明人 YAMAMOTO SEIJI;YOKOGAWA KATANOBU;TAJI SHINICHI
分类号 B24B37/00;H01L21/304;H01L21/3105;H01L21/311;H01L21/321;H01L21/3213;(IPC1-7):B24B37/00 主分类号 B24B37/00
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